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 SPU07N60S5 SPD07N60S5 Cool MOSTM Power Transistor
Feature * New revolutionary high voltage technology
* Worldwide best RDS(on) in TO-251 and TO-252
VDS RDS(on) ID
P-TO252.
2 3 1
600 0.6 7.3
P-TO251.
V A
* Ultra low gate charge * Periodic avalanche rated * Extreme dv/dt rated * Ultra low effective capacitances * Improved transconductance
1
2
3
Type
Package
Ordering Code
SPU07N60S5 SPD07N60S5
P-TO251. P-TO252.
Q67040-S4196 Q67040-S4186
Marking 07N60S5
07N60S5
Maximum Ratings Parameter
Continuous drain current
TC = 25 C TC = 100 C
Symbol
ID
Value
7.3 4.6
Unit
A
Pulsed drain current, tp limited by Tjmax Avalanche energy, single pulse
I D = - A, V DD = 50 V
I D puls EAS
14.6 230 0.5 7.3 20
30
mJ
Avalanche energy, repetitive tAR limited by Tjmax1) EAR
I D = 7.3 A, VDD = 50 V
Avalanche current, repetitive tAR limited by Tjmax I AR Gate source voltage VGS Gate source voltage AC (f >1Hz)
Power dissipation, T C = 25C
A V W C
VGS Ptot T j , T stg
83 -55... +150
Operating and storage temperature
Rev. 2.1
Page 1
2004-03-30
SPU07N60S5 SPD07N60S5
Maximum Ratings Parameter
Drain Source voltage slope
V DS = 480 V, ID = 7.3 A, Tj = 125 C
Symbol
dv/dt
Value
20
Unit
V/ns
Thermal Characteristics Parameter
Thermal resistance, junction - case Thermal resistance, junction - ambient, leaded SMD version, device on PCB: @ min. footprint @ 6 cm2 cooling area 2) Soldering temperature, 1.6 mm (0.063 in.) from case for 10s
Tsold
Symbol min.
RthJC RthJA RthJA
Values typ.
-
Unit max.
1.5 75 75 50 260 C K/W
-
Electrical Characteristics, at Tj=25C unless otherwise specified Parameter Symbol Conditions min.
Drain-source breakdown voltage V(BR)DSS V GS=0V, ID=0.25mA Drain-Source avalanche V(BR)DS V GS=0V, ID=7.3A breakdown voltage Gate threshold voltage Zero gate voltage drain current
VGS(th) I DSS
ID=350, VGS=V DS
Values typ.
700 4.5 0.5 0.54 1.46 19
Unit max.
5.5 A 1 100 100 0.6 nA
600 3.5 -
V
V DS=600V, VGS=0V, Tj=25C, Tj=150C
Gate-source leakage current
I GSS
V GS=20V, VDS=0V V GS=10V, ID=4.6A, Tj=25C Tj=150C
Drain-source on-state resistance RDS(on)
Gate input resistance
RG
f=1MHz, open Drain
Rev. 2.1
Page 2
2004-03-30
SPU07N60S5 SPD07N60S5
Electrical Characteristics , at Tj = 25 C, unless otherwise specified Parameter Characteristics
Transconductance Input capacitance Output capacitance Reverse transfer capacitance g fs Ciss Coss Crss
V GS=0V, V DS=0V to 480V V DS2*I D*RDS(on)max,
ID=4.6A
Symbol
Conditions min.
V DD=350V, V GS=0/10V,
ID=7.3A, RG=12
Values typ.
4 970 370 10 30 55 120 40 170 20
Unit max.
255 30 ns pF S pF
V GS=0V, V DS=25V, f=1MHz
Effective output capacitance,3) Co(er) energy related Effective output capacitance,4) Co(tr) time related
Turn-on delay time Rise time Turn-off delay time Fall time t d(on) tr t d(off) tf
-
Gate Charge Characteristics Gate to source charge Qgs Gate to drain charge Gate charge total Gate plateau voltage Qgd Qg
VDD=350V, ID=7.3A
-
7.5 16.5 27 8
35 -
nC
VDD=350V, ID=7.3A, VGS=0 to 10V
V(plateau) VDD=350V, ID=7.3A
V
1Repetitve avalanche causes additional power losses that can be calculated as P =EAR*f. AV 2Device on 40mm*40mm*1.5mm epoxy PCB FR4 with 6cm (one layer, 70 m thick) copper area for drain connection. PCB is vertical without blown air. 3C is a fixed capacitance that gives the same stored energy as Coss while VDS is rising from 0 to 80% V
o(er)
DSS.
4C o(tr) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS.
Rev. 2.1
Page 3
2004-03-30
SPU07N60S5 SPD07N60S5
Electrical Characteristics, at Tj = 25 C, unless otherwise specified Parameter Inverse diode continuous forward current Inverse diode direct current, pulsed Inverse diode forward voltage Reverse recovery time Reverse recovery charge VSD trr Qrr
VGS=0V, IF=IS VR=350V, IF =IS , diF/dt=100A/s
Symbol IS ISM
Conditions min.
TC=25C
Values typ. 1 750 4.9 max. 7.3 14.6 1.2 1275 -
Unit A
V ns C
Typical Transient Thermal Characteristics Symbol Value typ. Unit Symbol Value typ. Unit
Thermal resistance R th1 R th2 R th3 R th4 R th5 R th6 0.024 0.046 0.085 0.308 0.317 0.112 K/W
Thermal capacitance Cth1 Cth2 Cth3 Cth4 Cth5 Cth6 0.00012 0.0004578 0.000645 0.001867 0.004795 0.045 Ws/K
Tj P tot (t)
R th1
R th,n
T case
E xternal H eatsink
C th1
C th2
C th,n T am b
Rev. 2.1
Page 4
2004-03-30
SPU07N60S5 SPD07N60S5
1 Power dissipation 2 Safe operating area
Ptot = f (TC)
100
SPU07N60S5
ID = f ( V DS ) parameter : D = 0 , T C=25C
10 2
W
80 70
A
10 1
Ptot
60 50 40 30 20 10 0 0
ID
10 0
10 -1
tp = 0.001 ms tp = 0.01 ms tp = 0.1 ms tp = 1 ms DC
20
40
60
80
100
120
C
160
10 -2 0 10
10
1
10
2
TC
10 V VDS
3
3 Typ. output characteristic
4 Typ. output characteristic
ID = f (VDS); Tj=25C parameter: tp = 10 s, VGS
25
ID = f (VDS); Tj=150C parameter: tp = 10 s, VGS
12
20V
A
12V
A
20V 12V 10V
9V
ID
15
10V
ID
8
8.5V
6
9V
8V
10 4
8V
7.5V 7V
5
7V
2
6.5V 6V
0 0
5
10
15
V VDS
25
0 0
5
10
15
V VDS
25
Rev. 2.1
Page 5
2004-03-30
SPU07N60S5 SPD07N60S5
5 Typ. drain-source on resistance 6 Drain-source on-state resistance
RDS(on)=f(ID) parameter: Tj=150C, VGS
3
RDS(on) = f (Tj) parameter : ID = 4.6 A, VGS = 10 V
3.4
SPU07N60S5
m
2.8
RDS(on)
2 1.5
RDS(on)
2.4 2 1.6
1 0
20V 12V 10V 9V 8.5V 8V 7.5V 7V 6.5V 6V
2 4 6 8 10
1.2 0.8 0.4 0 -60 98% typ
A ID
14
-20
20
60
100
C
180
Tj
7 Typ. transfer characteristics
8 Typ. gate charge VGS = f (Q Gate) parameter: ID = 7.3 A pulsed
16
V
SPU07N60S5
ID= f ( VGS ); VDS 2 x ID x RDS(on)max parameter: tp = 10 s
24
A
20 18
0.2 VDS max
12 0.8 VDS max
VGS
ID
16 14 12 10
25 C 150 C
10
8
6 8 6 4 2 2 0 0 4 8 12 4
V
20
0 0
4
8
12
16
20
24
28
32 nC 38
VGS
Q Gate
Page 6
Rev. 2.1
2004-03-30
SPU07N60S5 SPD07N60S5
9 Forward characteristics of body diode 10 Avalanche SOA
IF = f (VSD) parameter: Tj , tp = 10 s
10
2 SPU07N60S5
IAR = f (tAR) par.: Tj 150 C
8
A
A
6
IAR
10
1
IF
5
T j(START)=25C
4
10 0 Tj = 25 C typ Tj = 150 C typ Tj = 25 C (98%) Tj = 150 C (98%) 10 -1 0 0.4 0.8 1.2 1.6 2 2.4 V 3
3
T j(START)=125C
2
1
0 -3 10
10
-2
10
-1
10
0
10
1
10
2
VSD
4 s 10 tAR
11 Avalanche energy
12 Drain-source breakdown voltage V(BR)DSS = f (Tj)
720
SPU07N60S5
EAS = f (Tj) par.: ID = - A, VDD = 50 V
260
mJ
220
V
EAS
180 160 140 120 100 80 60 40 20 0 20 40 60 80 100 120
V(BR)DSS
C
200
680 660 640 620 600 580 560 540 -60
160
-20
20
60
100
C
180
Tj
Tj
Page 7
Rev. 2.1
2004-03-30
SPU07N60S5 SPD07N60S5
13 Avalanche power losses 14 Typ. capacitances
PAR = f (f ) parameter: E AR=0.5mJ
300
C = f (VDS) parameter: V GS=0V, f=1 MHz
10 4
pF W
Ciss
10 3
PAR
200
C
150 10 2
Coss
100 10 1 50
Crss
04 10
10
5
MHz f
10
6
10 0 0
100
200
300
400
V
600
VDS
15 Typ. Coss stored energy
Eoss=f(VDS)
5.5
J
4.5 4
Eoss
3.5 3 2.5 2 1.5 1 0.5 0 0 100 200 300 400
V
600
VDS
Rev. 2.1
Page 8
2004-03-30
SPU07N60S5 SPD07N60S5
Definition of diodes switching characteristics
Rev. 2.1
Page 9
2004-03-30
SPU07N60S5 SPD07N60S5
P-TO-252-3-1 (D-PAK)
P-TO-251-3-1 (I-PAK)
6.5 +0.15 -0.10 A
1 0.1
2.3 +0.05 -0.10 B 0.9 +0.08 -0.04
5.4 0.1
C
6.22 -0.2
0.15 max per side
9.3 0.4
3 x 0.75 0.1 2.28 4.56 0.25
M
0.5 +0.08 -0.04 1.0 ABC
GPT09050
All metal surfaces tin plated, except area of cut.
Rev. 2.1
Page 10
2004-03-30
SPU07N60S5 SPD07N60S5
Published by Infineon Technologies AG, Bereichs Kommunikation St.-Martin-Strasse 53, D-81541 Munchen (c) Infineon Technologies AG 1999 All Rights Reserved. Attention please! The information herein is given to describe certain components and shall not be considered as warranted characteristics. Terms of delivery and rights to technical change reserved. We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits, descriptions and charts stated herein. Infineon Technologies is an approved CECC manufacturer. Information For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office in Germany or our Infineon Technologies Reprensatives worldwide (see address list). Warnings Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Rev. 2.1
Page 11
2004-03-30


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